DocumentCode
1713661
Title
A precorrected-FFT approach for capacitance extraction of general three-dimensional structures
Author
Xiaochun Nie ; Lewei Li ; Ning Yuan
Author_Institution
Nat. Univ. of Singapore, Singapore
Volume
3
fYear
2001
Firstpage
28
Abstract
In the design of high performance integrated circuits and integrated circuit packaging, there are many cases where the self and coupling capacitances are important for determining final circuit speeds or functionality. The traditional boundary-element technique and Gaussian elimination for solving the integral equation associated with the capacitance extraction problem require O(N/sup 3/) operations and O(N/sup 2/) memory storage. These approaches become computationally intractable when a large number of elements are used, thus limiting the size of the problem that can be analyzed. In this paper, a generalized conjugate residual iterative technique is used to solve the linear system arising from the discretization, and a precorrected-FFT method is then employed to accelerate the matrix-vector products in the iterates. This technique requires O(NlogN) operations and O(N) memory storage to perform a potential calculation.
Keywords
capacitance; computational complexity; conducting bodies; electric potential; electromagnetic coupling; fast Fourier transforms; integral equations; iterative methods; 3D structures; Gaussian elimination; boundary-element technique; capacitance extraction; circuit speeds; conducting sphere; coupling capacitance; generalized conjugate residual iterative technique; integral equation; integrated circuit design; integrated circuit packaging; linear system; matrix-vector products; memory storage; potential integral equation; precorrected-FFT; self capacitance; three-dimensional structures; Acceleration; Capacitance; Character generation; Conductors; Equations; High speed integrated circuits; Integrated circuit packaging; Linear systems; Testing; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7070-8
Type
conf
DOI
10.1109/APS.2001.960023
Filename
960023
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