Title :
Optically scanning electric field probe system
Author :
Suzuki, Eiji ; Arakawa, Satoru ; Ota, Huoyasu ; Arai, Ken Ichi ; Sato, Risaburo
Author_Institution :
Sendai EMC Res. Center, Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan
Abstract :
We present an optically scanning electric field probe system designed to provide high-speed measurements of electric field distributions near PCB or LSI chips with high spatial resolution up to the gigahertz range. The optical probe system uses an electro-optic crystal and a scanned laser beam for high-speed measurements. The probe provides measurement speed of 0.1 seconds per point. We examined probe characteristics of frequency response, linearity, minimum detectable field strength, and spatial resolution up to 10 GHz.
Keywords :
electric field measurement; electro-optical devices; measurement by laser beam; optical scanners; optical sensors; probes; 0 to 10 GHz; 0.1 s; LSI chips; PCB; electric field distribution measurements; electro-optic crystal; field strength; frequency response; linearity; optical probe; optically scanning electric field probe system; scanned laser beam; spatial resolution; Electric variables measurement; High speed optical techniques; Large scale integration; Laser beams; Lasers and electrooptics; Optical design; Probes; Semiconductor device measurement; Spatial resolution; Velocity measurement;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1350022
