Title :
The design of analog self-checking circuits
Author :
Vinnakota, Bapiraju ; Harjani, Ramesh
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
In this paper we introduce a new class of analog circuits, self-checking analog circuits. We develop and discuss methods to design members of this new class. We target the class of fully differential analog circuits and use the inherent dual-rail code to develop self-checking circuits. We describe the design of a self-checking operational amplifier and the associated subcircuits. Our methodology has wide application as many analog circuits already are or can be transformed into fully differential circuits
Keywords :
analogue circuits; circuit analysis computing; design for testability; differential amplifiers; linear integrated circuits; mixed analogue-digital integrated circuits; operational amplifiers; circuit simulation; differential analog code; fully differential analog circuits; inherent dual-rail code; mixed signal ICs; online error detection; redesign-for-reliability; self-checking analog circuits; self-checking circuit design; self-checking operational amplifier; Analog circuits; Circuit faults; Circuit testing; Design methodology; Digital systems; Electrical fault detection; Error correction; Fault detection; Filters; Logic circuits;
Conference_Titel :
VLSI Design, 1994., Proceedings of the Seventh International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-8186-4990-9
DOI :
10.1109/ICVD.1994.282658
