Title :
International web course on mixed signal IC test
Author :
Kim, Bruce C. ; Varadarajan, Vijay ; Park, Se-Hyun
Author_Institution :
Arizona State University
Keywords :
Circuit testing; Electronic equipment testing; Electronics packaging; IEEE news; Integrated circuit noise; Integrated circuit testing; Mixed analog digital integrated circuits; Portals; Streaming media; System testing;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216372
