Title :
Modeling residual thermal stress-induced integrated optical waveguides on Bi12GeO20 substrate for electrooptic modulation application
Author :
Sato, Sandra Sayuri ; Santos, Josemir C. ; Franco, Marcos A R
Author_Institution :
Escola Politec.-EP, Univ. de Sao Paulo-USP, Sao Paulo, Brazil
Abstract :
The residual thermal stress study of an optical waveguide based on isotropic material (bismuth germanate, BGO), the Pockels eletro-optic effect and the modal optical analyses were investigated for the optical modulation purpose. The analyses were performed by a full vector finite element based program. The optical propagation characteristics of the stress-induced waveguides and the main electro-optic parameters were evaluated considering different geometrical design.
Keywords :
Pockels effect; bismuth compounds; electro-optical modulation; finite element analysis; integrated optics; internal stresses; light propagation; optical waveguides; Bi12GeO20; Pockels eletro-optic effect; bismuth germanate; electro-optic parameters; electrooptic modulation application; full vector finite element based program; integrated optics; isotropic material; modal optical analyses; optical modulation purpose; optical propagation characteristics; residual thermal stress-induced integrated optical waveguides; Bismuth; Finite element methods; Geometrical optics; Integrated optics; Optical materials; Optical modulation; Optical waveguides; Performance analysis; Residual stresses; Thermal stresses; integrated optic; modulator; optical waveguide;
Conference_Titel :
Microwave and Optoelectronics Conference (IMOC), 2009 SBMO/IEEE MTT-S International
Conference_Location :
Belem
Print_ISBN :
978-1-4244-5356-6
Electronic_ISBN :
1679-4389
DOI :
10.1109/IMOC.2009.5427497
