DocumentCode
1714347
Title
Microstructural and performance implications of gold in Su-Ag-Cu-Sb interconnections
Author
Peng, Weiqun ; Dunford, Steve ; Viswanadham, Puligandla ; Quander, Stephen
Author_Institution
Nokia Corporation
fYear
2003
Firstpage
809
Lastpage
815
Keywords
Assembly; Ceramics; Environmentally friendly manufacturing techniques; Gold; Intermetallic; Lead; Microstructure; Soldering; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216382
Filename
1216382
Link To Document