Title : 
Microstructural and performance implications of gold in Su-Ag-Cu-Sb interconnections
         
        
            Author : 
Peng, Weiqun ; Dunford, Steve ; Viswanadham, Puligandla ; Quander, Stephen
         
        
            Author_Institution : 
Nokia Corporation
         
        
        
        
        
            Keywords : 
Assembly; Ceramics; Environmentally friendly manufacturing techniques; Gold; Intermetallic; Lead; Microstructure; Soldering; Temperature; Testing;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
         
        
        
            Print_ISBN : 
0-7803-7791-5
         
        
        
            DOI : 
10.1109/ECTC.2003.1216382