DocumentCode :
1714861
Title :
Diagnostics and experiments on LAPPS
Author :
Leonhardt, Darin ; Murphy, D.P. ; Walton, S.G. ; Meger, R.A. ; Fernsler, R.F. ; Pechacek, R.E.
Author_Institution :
Div. of Plasma Phys., US Naval Res. Lab., Washington, DC, USA
fYear :
1999
Firstpage :
267
Abstract :
Summary form only given. NRL is developing a new plasma processing reactor called the ´Large Area Plasma Processing System´ with applications to semiconductor processing and other forms of surface modification. The system consists of a planar plasma distribution generated by a magnetically collimated sheet of 2-5 kV, 10 mA/cm/sup 2/ electrons injected into a neutral gas background. This beam ionization process is both efficient at plasma production and readily scalable to large (square meters) area. The use of a beam ionization source largely decouples the plasma production from the reactor chamber. Temporally resolved measurements of the plasma sheet using Langmuir probes, spectrally resolved optical emission, microwave interferometry, and cyclotron harmonic microwave emission will be presented. Results of initial processing tests using an oxygen plasma showing isotropic ashing of a photoresist will be shown. Progress in the development of a DC hot filament cathode will be presented along with the status of the 1 m/sup 2/ UHV chamber for future processing tests.
Keywords :
Langmuir probes; plasma diagnostics; plasma materials processing; plasma pressure; plasma production; semiconductor technology; 2 to 5 kV; LAPPS; Langmuir probes; Large Area Plasma Processing System; UHV chamber; beam ionization process; beam ionization source; cyclotron harmonic microwave emission; dc hot filament cathode; initial processing tests; isotropic ashing; magnetically collimated sheet; microwave interferometry; neutral gas background; oxygen plasma; photoresist; planar plasma distribution; plasma processing reactor; plasma production; processing tests; semiconductor processing; spectrally resolved optical emission; surface modification; temporally resolved measurements; Inductors; Ion beams; Ionization; Particle beams; Plasma applications; Plasma diagnostics; Plasma materials processing; Plasma measurements; Plasma sources; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5224-6
Type :
conf
DOI :
10.1109/PLASMA.1999.829604
Filename :
829604
Link To Document :
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