DocumentCode
1714878
Title
Implementation of low-cost failure detection system using resistance spectroscopy
Author
Batra, Ashish ; Fang, Lee ; Constable, J.H.
Author_Institution
State University of New York
fYear
2003
Firstpage
933
Lastpage
939
Keywords
Electric resistance; Electrical resistance measurement; Electronic packaging thermal management; Instruments; Integrated circuit interconnections; Life estimation; Spectroscopy; Temperature; Testing; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216402
Filename
1216402
Link To Document