Title :
Implementation of low-cost failure detection system using resistance spectroscopy
Author :
Batra, Ashish ; Fang, Lee ; Constable, J.H.
Author_Institution :
State University of New York
Keywords :
Electric resistance; Electrical resistance measurement; Electronic packaging thermal management; Instruments; Integrated circuit interconnections; Life estimation; Spectroscopy; Temperature; Testing; Thermal resistance;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216402
