DocumentCode
1715057
Title
Hybrid power modules using a metal matrix composite baseplate: An evaluation
Author
Azzopardi, Stéphane ; Thébaud, Jean-Marc ; Woirgard, Eric ; Zardini, Christian
Author_Institution
Bordeaux I Univ., Talence, France
fYear
1998
Firstpage
173
Lastpage
178
Abstract
This paper presents an evaluation of the reliability of hybrid power modules using a metal matrix composite baseplate. In this study, we investigate the possible damage in the assemblies by measuring their thermal resistance. Several 2"/spl times/1" power module samples including four bipolar transistors (BUX48) have been realized with the use of a vacuum bake soldering machine allowing reduction of voids in the solder joints. The test vehicles have been submitted to liquid-liquid thermal shocks (+125/spl deg/C/-55/spl deg/C). Every 250 thermal shocks, two samples were extracted in order to measure the thermal resistance. Results show that even after 2700 shocks, only a very small increase in the thermal resistance of the assemblies is observed. In comparison, modules with a copper baseplate show a strong increase in thermal resistance and fail much earlier. As a consequence, in applications where thermal cycling is involved, hybrid power modules with metal matrix composite baseplates will offer much better reliability. SEM observations conducted on cross-sectioned samples and acoustic analysis do not show the typical cracks generally observed in solder joints between the direct bonded copper substrate and the copper baseplate of aged modules.
Keywords
acoustic analysis; ageing; aluminium; hybrid integrated circuits; modules; particle reinforced composites; power bipolar transistors; scanning electron microscopy; semiconductor device packaging; semiconductor device reliability; silicon compounds; soldering; thermal analysis; thermal resistance; thermal shock; thermal stresses; voids (solid); -55 to 125 C; 1 in; 2 in; Cu; SEM; SiC particle reinforced Al composite baseplate; SiC-Al; acoustic analysis; aged modules; bipolar transistors; copper baseplate; cracks; cross-sectioned samples; direct bonded copper substrate; early failure; hybrid power module damage; hybrid power modules; liquid-liquid thermal shocks; metal matrix composite baseplate; power modules; reliability; solder joint voids; solder joints; test vehicles; thermal cycling; thermal resistance; vacuum bake soldering machine; Assembly; Bipolar transistors; Copper; Electric shock; Electrical resistance measurement; Multichip modules; Soldering; Testing; Thermal resistance; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
IEMT/IMC Symposium, 2nd 1998
Conference_Location
Tokyo, Japan
Print_ISBN
0-7803-5090-1
Type
conf
DOI
10.1109/IEMTIM.1998.704558
Filename
704558
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