Title :
Investigation of the impact of conductor surface roughness on interconnect frequency-dependent ohmic loss
Author :
Proekt, Leonid ; Cangellaris, Andreas C.
Author_Institution :
University of Illinois
Keywords :
Conductivity; Conductors; Corrugated surfaces; Electromagnetic fields; Electromagnetic modeling; Frequency; Rough surfaces; Surface resistance; Surface roughness; Surface waves;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216412
