A statistical method for the analysis of CMOS process fluctuations on dynamic performance

Author

de Almeida, M. ; Régnier, X. ; Daga, J.M., II ; Robert, M. ; Auvergne, D.

Author_Institution

Aerospatiale, Suresnes, France

fYear

1997

Firstpage

137

Lastpage

142

Abstract

This paper describes the efforts of the Aerospatiale Joint Research Center in the development of a statistical method to assess the influence of CMOS process fluctuations on ASIC dynamic performance. After a brief description of our ASIC problematic, each step of the proposed method is presented. Then, the software working environment is described as well as simulation models. The first results obtained for ring oscillators by our method are compared to silicon measurements and finally, the benefits and restrictions of the method are discussed

Keywords

CMOS integrated circuits; application specific integrated circuits; semiconductor process modelling; statistical analysis; ASIC dynamic performance; CMOS process fluctuations; ring oscillator; silicon measurement; simulation model; software environment; statistical analysis; Aerodynamics; Application specific integrated circuits; CMOS process; Fluctuations; Foundries; Monitoring; Performance analysis; Performance evaluation; Production; Statistical analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-3243-1

Type

conf

DOI

10.1109/ICMTS.1997.589361

Filename

589361