DocumentCode :
1715306
Title :
Comparative study of the Teflon® electromagnetic parameters (permittivity and permeability) experimentally obtained and numerically simulated
Author :
De Paula, Adriano Luiz ; Barroso, Joaquim José ; Rezende, Mirabel Cerqueira
Author_Institution :
Div. of Mater., IAE, Sao Jose dos Campos, Brazil
fYear :
2009
Firstpage :
519
Lastpage :
522
Abstract :
The present report branches out into two related topics. The first is concerned with the implementation of a computational modeling to predict the behavior of electromagnetic materials in confined environment by using electromagnetic three-dimensional simulation. The second topic re-examines the Nicolson-Ross-Weir mathematical model to retrieve the constitutive parameters (complex permittivity and permeability) of a Teflon® sample from the measurement of scattering coefficients. Recognizing the importance of this issue for the development of radar absorbing materials (RAMs), the present study contributes for the characterization of electromagnetic materials and, consequently, for the processing of RAMs in the microwave range.
Keywords :
electromagnetic wave scattering; magnetic permeability; permittivity; radar absorbing materials; Nicolson-Ross-Weir mathematical model; Teflon; electric permittivity; electromagnetic material; electromagnetic parameter; electromagnetic three-dimensional simulation; magnetic permeability; radar absorbing material; Character recognition; Computational modeling; Electromagnetic measurements; Electromagnetic scattering; Mathematical model; Permeability measurement; Permittivity measurement; Predictive models; Radar scattering; Scattering parameters; computational modeling; electric permittivity; magnetic permeability; radar absorbing material;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Optoelectronics Conference (IMOC), 2009 SBMO/IEEE MTT-S International
Conference_Location :
Belem
ISSN :
1679-4389
Print_ISBN :
978-1-4244-5356-6
Electronic_ISBN :
1679-4389
Type :
conf
DOI :
10.1109/IMOC.2009.5427532
Filename :
5427532
Link To Document :
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