• DocumentCode
    1715390
  • Title

    Low-cost redundancy identification for combinational circuits

  • Author

    Iyer, Mahesh A. ; Abramovici, Miron

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    1994
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    This paper presents a novel fault independent algorithm for redundancy identification (FIRE) in combinational circuits. The algorithm is based on a simple concept that a fault which requires an illegal combination of values as a necessary condition for its detection is undetectable and hence redundant. It uses implications to find a subset of such faults whose detection requires conflicts on certain lines in the circuit. Our results on benchmark circuits indicate that we find a large number of redundancies, much faster when compared to a test-generation-based approach for redundancy identification
  • Keywords
    combinatorial circuits; fault location; logic testing; redundancy; combinational circuits; fault independent algorithm; low-cost redundancy identification; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1994., Proceedings of the Seventh International Conference on
  • Conference_Location
    Calcutta
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-4990-9
  • Type

    conf

  • DOI
    10.1109/ICVD.1994.282710
  • Filename
    282710