• DocumentCode
    1715414
  • Title

    Characterization of power amplifiers using noise loading

  • Author

    Pierro, John A.

  • Author_Institution
    AIL Syst. Inc., Deer Park, NY, USA
  • fYear
    1996
  • Firstpage
    303
  • Lastpage
    308
  • Abstract
    Noise power ratio (NPR) testing is a very powerful, yet simple way of determining the dynamic range and nonlinear properties of power amplifiers. It provides a quantitative assessment of spectral regrowth and gives insight into the power and efficiency capabilities of the amplifier under signal conditions that emulate those in the actual system. The authors present test results for a 10 W GaAs MESFET amplifier
  • Keywords
    MESFET integrated circuits; field effect analogue integrated circuits; integrated circuit noise; integrated circuit testing; nonlinear network analysis; power amplifiers; 10 W; GaAs; GaAs MESFET amplifier; dynamic range; noise loading; noise power ratio testing; nonlinear properties; power amplifiers; quantitative assessment; spectral regrowth; Bandwidth; Electromagnetic spectrum; Frequency division multiaccess; Hardware; Modems; Multiaccess communication; Power amplifiers; Quadrature amplitude modulation; Quadrature phase shift keying; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ELECTRO '96. Professional Program. Proceedings.
  • Conference_Location
    Somerset, NJ
  • Print_ISBN
    0-7803-3271-7
  • Type

    conf

  • DOI
    10.1109/ELECTR.1996.501243
  • Filename
    501243
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1715414