DocumentCode :
1715648
Title :
Chemi-ionization in mercury and neon discharges
Author :
Sheverev, V. ; Folan, L. ; Stepaniuk, V. ; Lister, G.
Author_Institution :
Polytech. Univ., Brooklyn, NY, USA
fYear :
1999
Firstpage :
284
Abstract :
Summary form only given, as follows. Modeling of discharge light sources is becoming increasingly important in predicting device performance and determination of optimal regimes for their operation. A good knowledge of the elementary processes occurring under non-equilibrium conditions is a prerequisite for any model. Chemi-ionization processes involving collisions of excited atoms play a crucial role in many lighting discharges, both for low (a few torr) and higher (>10 torr) gas pressures. The understanding of such processes and their role in discharge power balance is scant, and quantitative data on the rate coefficients is inadequate. Experimental studies of chemi-ionization in collisions of metastable neon and mercury atoms were recently initiated at Brooklyn Polytechnic University. Rate coefficients for collisions between two p/sup 5/3s/sup 13/P/sub 2/ and between 2p/sup 5/3s/sup 13/P/sub 2/ and /sup 3/P/sub 1/ excited neon atoms were measured using plasma electron spectroscopy. Investigation of chemi-ionization in collisions of 6/sup 3/P/sub 0,1,2/ mercury states is under way and the intermediate results will be reported.
Keywords :
atomic collisions; discharge lamps; discharges (electric); excited states; ionisation; light sources; mercury (metal); mercury vapour lamps; neon; plasma collision processes; Hg; Hg discharges; Ne; Ne discharges; chemi-ionization; discharge light sources; excited atoms collisions; modeling; nonequilibrium conditions; plasma electron spectroscopy; rate coefficients; Atomic measurements; Chemical elements; Electrons; Fault location; High intensity discharge lamps; Light sources; Metastasis; Plasma chemistry; Plasma measurements; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5224-6
Type :
conf
DOI :
10.1109/PLASMA.1999.829634
Filename :
829634
Link To Document :
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