• DocumentCode
    171596
  • Title

    A W-band balun integrated probe with common mode matching network

  • Author

    Chunhu Zhang ; Bauwens, M. ; Barker, N.S. ; Weikle, Robert M. ; Lichtenberger, Arthur W.

  • Author_Institution
    Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2014
  • fDate
    1-6 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    There has been a growing interest in developing differential Millimeter-wave Monolithic Integrated Circuits (MMICs) in recent years. The characterization infrastructure for these differential devices however, is still limited at higher frequencies. In this paper, a balun integrated probe is designed to cover the entire W-band (75 - 110 GHz) with the potential to be scaled to even higher frequencies. Test structures of the balun are characterized and found to agree well with simulated results for the entire W-band, while the balun integrated probe is characterized from 90 to 115 GHz, also agreeing well with simulation. Over the frequency range measured, the balun integrated probe has lower than -22 dB coupling between the single-ended input and common mode output, as well as between the common and differential modes. Furthermore, the return loss for the differential output and single-ended input modes are better than 10 dB, while the common mode return loss is also better than 10 dB.
  • Keywords
    MMIC; baluns; millimetre wave devices; MMIC; W-band balun integrated probe; common mode matching network; differential millimeter-wave monolithic integrated circuits; differential modes; frequency 75 GHz to 110 GHz; frequency 90 GHz to 115 GHz; frequency range measurement; single-ended input modes; Calibration; Impedance matching; Loss measurement; Ports (Computers); Probes; Resistors; Thickness measurement; balun integrated probe; common mode matching; differential circuits characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium (IMS), 2014 IEEE MTT-S International
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/MWSYM.2014.6848601
  • Filename
    6848601