Title :
Analysis of PF flip-chip on-chip inductance with novel measurement technology
Author :
Lee, Gye-An ; Megahed, M. ; De Flaviis, Franco
Author_Institution :
University of California
Keywords :
Active inductors; Computational modeling; Electromagnetic induction; Electromagnetic measurements; Inductance measurement; Integrated circuit technology; Magnetic field measurement; Packaging; Radio frequency; Silicon;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216453
