DocumentCode
1716066
Title
Analysis of PF flip-chip on-chip inductance with novel measurement technology
Author
Lee, Gye-An ; Megahed, M. ; De Flaviis, Franco
Author_Institution
University of California
fYear
2003
Firstpage
1253
Lastpage
1257
Keywords
Active inductors; Computational modeling; Electromagnetic induction; Electromagnetic measurements; Inductance measurement; Integrated circuit technology; Magnetic field measurement; Packaging; Radio frequency; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216453
Filename
1216453
Link To Document