Title :
High frequency modeling and characterization of pin and land grid array sockets
Author :
Han, Dong-Ho ; Prokofiev, Victor ; Leigh, Wojewoda ; Polka, Lesley ; Ruttan, Thomas
Author_Institution :
Intel Corporation
Keywords :
Calibration; Conducting materials; Dielectric materials; Electronics packaging; Fixtures; Frequency; Pins; Scattering parameters; Sockets; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216455
