Title :
Simple and accurate determination of complex permittivity and skin effect of FR4 material in gigahertz regime
Author :
Bois, Karl J. ; Kirk, Brian ; Tsuk, Michael ; Quint, David
Author_Institution :
Hewlett-Packard Company
Keywords :
Conducting materials; Connectors; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Skin effect; Stripline; Transmission line measurements;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216457
