DocumentCode :
1716184
Title :
Measuring the Gain of Automatic Debug
Author :
Hansson, Daniel ; Uronen-Hansson, Heli
Author_Institution :
Verifyter AB, Lund, Sweden
fYear :
2013
Firstpage :
19
Lastpage :
22
Abstract :
The purpose of regression testing is to quickly catch any deterioration in quality of a product under development. The more frequently tests are run, the earlier new issues can be detected resulting in a larger burden for the engineers who need to manually debug all test failures, many of which are failing due to the same underlying bug. However, there are software tools that automatically debug the test failures back to the faulty change and notifies the engineer who made this change. By analyzing data from a real commercial ASIC project we aimed to measure whether bugs are fixed faster when using automatic debug tools compared to manual debugging. All bugs in an ASIC development project were analyzed over a period of 3 months in order to determine the time it took the bug to be fixed and to compare the results from both automatic and manual debug. By measuring the time from when the bug report was sent out by the automatic debug tool until the bug was fixed, we can show that bugs are fixed 4 times faster with automatic debug enabled. Bug fixing time was on average 5.7 hours with automatic debug and 23.0 hours for manual debug. The result was achieved by comparing bugs that were automatically debugged to those issues that could not be debugged by the tool, because those issues were outside the defined scope of the device under test. Such issues are still reported by the automatic debug tool but marked as requiring manual debug and is consequently a good point of comparison. A 4 times quicker bug fixing process is significant and can ultimately contribute to a shortening of a development project as the bug turnaround time is one of the key aspects defining the length of a project, especially in the later phase just before release.
Keywords :
application specific integrated circuits; integrated circuit testing; program debugging; regression analysis; ASIC development project; automatic debug tools; bug fixing process; bug report; bug turnaround time; commercial ASIC project; manual debugging; regression testing; software tools; test failures debug; Application specific integrated circuits; Computer bugs; Delays; Electronic mail; Manuals; Testing; automatic debug; continuous integration; regression testing; system-on-chip verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Type :
conf
DOI :
10.1109/MTV.2013.17
Filename :
6926095
Link To Document :
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