• DocumentCode
    1716544
  • Title

    Anti-counterfeit Techniques: From Design to Resign

  • Author

    Guin, Ujjwal ; Forte, Domenic ; Tehranipoor, Mohammad

  • Author_Institution
    CHASE Center, Univ. of Connecticut, Storrs, CT, USA
  • fYear
    2013
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    The emerging threat of counterfeit electronic components has become a major challenge over the past decade. To address this growing concern, a suite of tests for the detection of such parts has been created. However, due to the large test time and cost, it is fairly difficult to implement them. Moreover, the presence of different types of counterfeits in the supply chain - recycled, remarked, overproduced, out-of-spec/defective, cloned, forged documentation, and tampered - makes the detection even more challenging. In this paper, we present a detailed taxonomy of counterfeit types to analyze the vulnerabilities in the electronic component supply chain. We then present the state of knowledge on anti-counterfeit technologies to help prevent counterfeit components from ever entering into the supply chain and to provide capabilities for easy detection.
  • Keywords
    integrated circuit design; supply chain management; anticounterfeit techniques; counterfeit electronic components; electronic component supply chain; DNA; Foundries; Hardware; Integrated circuits; Reliability; Supply chains; Taxonomy; Avoidance Mechanisms; Counterfeit ICs; Design-for-Anti-Counterfeits; Supply Chain Vulnerabilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Type

    conf

  • DOI
    10.1109/MTV.2013.28
  • Filename
    6926108