Title :
Fast extraction of ellipses
Author :
Wang, Runsheng ; Hanson, Allen R. ; Riseman, Edward M.
Author_Institution :
Dept. of Electron. Tech., Changsha Inst. of Technol., Hunan, China
Abstract :
The process for fast extraction is divided into two steps: first, it looks for the areas where there might be ellipses by using heuristic function and a pyramid structure; then it finds the parameters of the ellipses in each area searched by a method that combines transformation of the feature space, projection, and optimum approximation approaches. Experiments indicate that both fast processing speed and suitable ellipse parameters are obtained
Keywords :
optimisation; pattern recognition; picture processing; ellipses; fast extraction; feature space; heuristic function; optimum approximation; projection; pyramid structure; Geometry; Image analysis; Image resolution; Information science; Machine vision; Parameter estimation; Shape; Solid modeling; Switches;
Conference_Titel :
Pattern Recognition, 1988., 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
0-8186-0878-1
DOI :
10.1109/ICPR.1988.28279
