• DocumentCode
    1716768
  • Title

    Fast extraction of ellipses

  • Author

    Wang, Runsheng ; Hanson, Allen R. ; Riseman, Edward M.

  • Author_Institution
    Dept. of Electron. Tech., Changsha Inst. of Technol., Hunan, China
  • fYear
    1988
  • Firstpage
    508
  • Abstract
    The process for fast extraction is divided into two steps: first, it looks for the areas where there might be ellipses by using heuristic function and a pyramid structure; then it finds the parameters of the ellipses in each area searched by a method that combines transformation of the feature space, projection, and optimum approximation approaches. Experiments indicate that both fast processing speed and suitable ellipse parameters are obtained
  • Keywords
    optimisation; pattern recognition; picture processing; ellipses; fast extraction; feature space; heuristic function; optimum approximation; projection; pyramid structure; Geometry; Image analysis; Image resolution; Information science; Machine vision; Parameter estimation; Shape; Solid modeling; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1988., 9th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    0-8186-0878-1
  • Type

    conf

  • DOI
    10.1109/ICPR.1988.28279
  • Filename
    28279
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1716768