Title :
New Approach Based on Double-Crossed Step-down-Stress Accelerated Life Testing
Author :
Yuming, Wang ; Jinyan, Cai ; Zhanqiang, Jia
Author_Institution :
Ordnance Eng. Coll., Shijiazhuang
Abstract :
New approach based on DCSDS-ALT which is a reverse process of traditional DCSUS-ALT is introduced. Procedure of this method is given, and numeral example is shown. Conclusions are that though DCSDS-ALT is not always better than DCSUS-ALT, its effect in improving testing efficiency is obvious when some product parameter reaches to certain value. For high reliability long lifetime test, this condition usually can be satisfied, so it is applicable.
Keywords :
Monte Carlo methods; life testing; reliability; Monte-Carlo simulation; double-crossed step-down-stress accelerated life testing; long lifetime test; reverse process; Acceleration; Degradation; Educational institutions; Electronic equipment testing; Instruments; Life estimation; Life testing; Lifetime estimation; Stress; Temperature; Accelerated life testing; Monte-Carlo; efficiency ratio; simulation; step down stress;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350419
