• DocumentCode
    1716874
  • Title

    X-ray backlighting density measurements of tungsten and aluminum wire and wire array Z-pinches

  • Author

    Hammer, D.A. ; Pikuz, S.A. ; Shelkovenko, T.A. ; Greenly, J.B. ; Sinars, D.B. ; Mingaleev, A.R.

  • Author_Institution
    Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
  • fYear
    1999
  • Firstpage
    309
  • Abstract
    Summary form only given. Calibrated density measurements in both the coronal plasmas and dense cores of exploding W wire and wire array Z-pinches, powered by the /spl sim/450 kA, 100 ns XP-pulser at Cornell University, have been made using two-frame X-ray backlighting in conjunction with known thickness W step wedges. The backlighting images are made by Mo wire X-pinch radiation filtered by 12.5 /spl mu/m Ti impinging upon a "sandwich" of films (Micrat VR, Kodak GWL, Kodak DEF) which have different sensitivities to increase the dynamic range of the method. A W step wedge filter is placed in front of the films, giving absolute line density calibration of each exposure with estimated errors ranging from 20 to 50%. Assuming X-ray absorption by the W plasma is the same as for the solid material, we are able to measure W areal densities from 3.2/spl times/10/sup 19/ to 2/spl times/10/sup 17//cm/sup 2/. These can be converted to number density assuming azimuthal symmetry.
  • Keywords
    Z pinch; aluminium; exploding wires; plasma density; plasma diagnostics; tungsten; 100 kA; 450 kA; 7.5 micron; Al; Kodak DEF; Kodak GWL; Micrat VR; Mo wire X-pinch radiation; Ti; W; W areal densities; W plasma; W step wedges; X-ray absorption; X-ray backlighting density measurements; XP-pulser; absolute line density calibration; azimuthal symmetry; coronal plasmas; dense cores; density measurements; exploding wires; films sandwich; wire array Z-pinches; Aluminum; Density measurement; Dynamic range; Plasma density; Plasma measurements; Plasma x-ray sources; Tungsten; Virtual reality; Wire; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
  • Conference_Location
    Monterey, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5224-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.1999.829684
  • Filename
    829684