DocumentCode
1716874
Title
X-ray backlighting density measurements of tungsten and aluminum wire and wire array Z-pinches
Author
Hammer, D.A. ; Pikuz, S.A. ; Shelkovenko, T.A. ; Greenly, J.B. ; Sinars, D.B. ; Mingaleev, A.R.
Author_Institution
Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
fYear
1999
Firstpage
309
Abstract
Summary form only given. Calibrated density measurements in both the coronal plasmas and dense cores of exploding W wire and wire array Z-pinches, powered by the /spl sim/450 kA, 100 ns XP-pulser at Cornell University, have been made using two-frame X-ray backlighting in conjunction with known thickness W step wedges. The backlighting images are made by Mo wire X-pinch radiation filtered by 12.5 /spl mu/m Ti impinging upon a "sandwich" of films (Micrat VR, Kodak GWL, Kodak DEF) which have different sensitivities to increase the dynamic range of the method. A W step wedge filter is placed in front of the films, giving absolute line density calibration of each exposure with estimated errors ranging from 20 to 50%. Assuming X-ray absorption by the W plasma is the same as for the solid material, we are able to measure W areal densities from 3.2/spl times/10/sup 19/ to 2/spl times/10/sup 17//cm/sup 2/. These can be converted to number density assuming azimuthal symmetry.
Keywords
Z pinch; aluminium; exploding wires; plasma density; plasma diagnostics; tungsten; 100 kA; 450 kA; 7.5 micron; Al; Kodak DEF; Kodak GWL; Micrat VR; Mo wire X-pinch radiation; Ti; W; W areal densities; W plasma; W step wedges; X-ray absorption; X-ray backlighting density measurements; XP-pulser; absolute line density calibration; azimuthal symmetry; coronal plasmas; dense cores; density measurements; exploding wires; films sandwich; wire array Z-pinches; Aluminum; Density measurement; Dynamic range; Plasma density; Plasma measurements; Plasma x-ray sources; Tungsten; Virtual reality; Wire; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location
Monterey, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5224-6
Type
conf
DOI
10.1109/PLASMA.1999.829684
Filename
829684
Link To Document