Title :
The к-μ Extreme distribution: Characterizing severe fading conditions
Author :
Rabelo, Guilherme Silveira ; Dias, Ugo Silva ; Yacoub, Michel Daoud
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Campinas, Campinas, Brazil
Abstract :
This paper presents the κ-μ Extreme fading distribution, which is used for characterizing mobile radio propagation under severe fading conditions. The distribution is adjusted to field data extracted from the literature and compared to another model recently proposed elsewhere, namely the Two-Ray model. Adjustment results show that the κ-μ Extreme distribution is flexible and suitable to model the severe fading conditions. A closed-form expression for the average BER in non-coherent binary modulation schemes is derived. Finally, performance of the selection combining technique is evaluated in terms of the outage probability.
Keywords :
diversity reception; error statistics; fading; modulation; κ-μ extreme fading distribution; average BER; closed-form expression; mobile radio propagation; noncoherent binary modulation schemes; selection combining technique; Bit error rate; Closed-form solution; Data mining; Diversity reception; Land mobile radio; Predictive models; Rayleigh channels; Weibull fading channels; Wireless LAN; Wireless sensor networks; к-μ Extreme Distribution; Fading Channels; Hyper-Rayleigh Fading; Severe Fading Conditions; Two-Ray Distribution;
Conference_Titel :
Microwave and Optoelectronics Conference (IMOC), 2009 SBMO/IEEE MTT-S International
Conference_Location :
Belem
Print_ISBN :
978-1-4244-5356-6
Electronic_ISBN :
1679-4389
DOI :
10.1109/IMOC.2009.5427590