DocumentCode
1717129
Title
Selective bridging of single-walled carbon nanotubes controlled with electric field applied to silicon structures
Author
Takei, Yusuke ; Hoshino, Kazunori ; Matsumoto, Kiyoshi ; Shimoyama, Isao
Author_Institution
Graduate Sch. of Inf. Sci. & Technol., Univ. of Tokyo, Japan
Volume
1
fYear
2005
Firstpage
101
Abstract
We have achieved controlling the number of bridging carbon nanotubes (CNTs) between silicon structures by applying an electric field during catalytic CVD. We fabricated a silicon gap where CNTs would bridge. From the SEM images after the CVD process, we observed that the electric field applied in parallel with the bridging direction was effective in increasing the number of bridging CNTs. On the other hand, the vertical electric field decreased the number of bridging CNTs.
Keywords
carbon nanotubes; chemical vapour deposition; electric field effects; elemental semiconductors; nanotechnology; silicon; C; SEM images; Si; catalytic CVD; electric field controlled selective bridging; selective growth; silicon structure CNT bridging; single-walled carbon nanotubes; Bridge circuits; Carbon nanotubes; Current density; Electrodes; Information science; Mass production; Mechanical factors; Micromanipulators; Silicon; Thermal force;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN
0-7803-8994-8
Type
conf
DOI
10.1109/SENSOR.2005.1496369
Filename
1496369
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