Title :
Characterization of dielectric properties of screen-printed MgTiO3-CaTiO3 composite thick films in the microwave frequency range
Author :
Marulanda, J.I. ; Lima, R.A.A. ; Carvalho, M.C.R. ; Almeida, A.F.L. ; Sombra, A.B.S. ; Demenicis, L.S.
Author_Institution :
Centro de Estudos em Telecomun., Pontificia Univ. Catolica do Rio de Janeiro, Rio de Janeiro, Brazil
Abstract :
Dielectric characterization of MgTiO3, CaTiO3 and MgTiO3(x)-CaTiO3(1-x) composite thick films with different concentrations (x = 0.95, 0.50, and 0.20) in the microwave frequency range at room temperature is presented. The films were fabricated by screen-printed method with thickness between 105 and 165 ¿m. Dielectric constant values between 4.2 and 17.5 and loss tangents between 0.0064 and 0.0098 were measured for frequencies in the range from 3.22 to 3.89 GHz using the coplanar waveguide (CPW) resonators technique. A relationship between the concentration ratio of MTO-CTO in the films and the dielectric constant is also presented.
Keywords :
calcium compounds; cavity resonators; coplanar waveguides; dielectric properties; dielectric thin films; magnesium compounds; titanium compounds; CPW resonators; MgTiO3-CaTiO3; coplanar waveguide; dielectric constant values; frequency 3.22 GHz to 3.89 GHz; microwave frequency range; screen-printed composite thick films; Ceramics; Coplanar waveguides; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric thin films; Frequency measurement; High-K gate dielectrics; Microwave frequencies; Thick films; CTO; MTO; high dielectric constant; microwave ceramic films; thick films;
Conference_Titel :
Microwave and Optoelectronics Conference (IMOC), 2009 SBMO/IEEE MTT-S International
Conference_Location :
Belem
Print_ISBN :
978-1-4244-5356-6
Electronic_ISBN :
1679-4389
DOI :
10.1109/IMOC.2009.5427598
