Title :
Degradation factors for eye diagrams using FDTD/SPICE
Author :
Orhanovic, Neven ; Divekar, Dileep ; Matsui, Norio
Author_Institution :
Applied Simulation Technology
Keywords :
Circuit simulation; Crosstalk; Degradation; Digital systems; Finite difference methods; Integrated circuit interconnections; SPICE; Scattering parameters; Signal analysis; Time domain analysis;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216513
