Title :
On The Amplitude Center Of Three Dimensional Sources
Author_Institution :
EMI / EMC & ELECTRICAL PROTECTION
Keywords :
Electromagnetic compatibility; Equations; Error correction; Fresnel reflection; Lighting; Measurement standards; Paints; Particle measurements; Protection; Time factors;
Conference_Titel :
Microwave Conference/Brazil, 1993., SBMO International
Print_ISBN :
0-7803-1288-0
DOI :
10.1109/SBMO.1993.589371
