Title :
Test-structure free modeling method for de-embedding the effects of pads on device modeling
Author :
Cha, Cheolung ; Huang, Zhaoran ; Jokerst, Nan M. ; Brooke, Martin A.
Author_Institution :
Georgia Institute of Technology
Keywords :
Atherosclerosis; Calibration; Circuit synthesis; Circuit testing; Electrical resistance measurement; Equivalent circuits; Integrated circuit interconnections; Microelectronics; Probes; Scattering parameters;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216530
