Intermittency study of a stressed-metal micro-spring sliding electrical contact

Author

Chow, Eugene M. ; Klein, Kevin ; Fork, David K. ; Hamschel, T. ; Chua, Christopher L. ; Wong, Lai ; Van Schuylenbergh, Koenraad

Author_Institution

Palo Alto Research Center (PARC)

fYear

2003

Firstpage

1714

Lastpage

1717

Keywords

Contacts; Gold; Integrated circuit interconnections; Packaging; Soldering; Springs; Substrates; Thermal expansion; Thermal resistance; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 2003. Proceedings. 53rd

ISSN

0569-5503

Print_ISBN

0-7803-7791-5

Type

DOI

10.1109/ECTC.2003.1216533

Filename

1216533

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