Application of the thru-network-line self-calibration method for free space material characterizations

Free space measurement systems can be used advantageously for non destructive and contactless material characterizations. These free space measurements are commonly performed with a four channel vector network analyzer, which allows the employment of self calibration methods. In this contribution a self-calibration procedure is investigated, which is based on a reciprocal and symmetrical network as one of the calibration standards. With regard to the characterization of dielectric materials the material under test can be described as a symmetrical and reciprocal network. Thus, the material under test can be used as a calibration standard within the self calibration procedure. Hence, the scattering parameters of the material under test are determined during the self calibration method. This contribution illustrates the application of the thru-network-line calibration method for free space material characterizations. This approach offers the possibility to perform free space material characterizations during the self calibration procedure without the necessity of any additional measurements.