• DocumentCode
    171852
  • Title

    A review on the testing method for low residual voltages in SPD

  • Author

    Young-Jun Lee ; Kihong Lee

  • Author_Institution
    SungJin Techwin Co., Ltd., Daejeon, South Korea
  • fYear
    2014
  • fDate
    11-18 Oct. 2014
  • Firstpage
    273
  • Lastpage
    277
  • Abstract
    Technical issues on measuring the low residual voltage (Vres) in SPD determined in international standards are reviewed. The SPD for power supplies represents residual voltages more than 1.5kV but the SPD for applications in low voltage data, communications and signaling circuits shows several tens ~ hundreds volts. Thus, it is necessary to determine detailed technical specifications in a technical standard for implementing its accurate measurements. However, there are no such detailed specifications in international standards and that may cause confusions in operating a certification system based on the international standard for SPD performance. Therefore, in this study, technical issues on international standards for measuring the low residual voltages of SPD are reviewed.
  • Keywords
    IEC standards; surge protection; voltage measurement; SPD; international standards; low residual voltage measurement; surge protective devices; Low voltage; Measurement uncertainty; Noise measurement; Probes; Standards; IEC; SPD; bandwith; impulse; residual voltage(Ures); voltage probe;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lightning Protection (ICLP), 2014 International Conference o
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/ICLP.2014.6973135
  • Filename
    6973135