DocumentCode
171852
Title
A review on the testing method for low residual voltages in SPD
Author
Young-Jun Lee ; Kihong Lee
Author_Institution
SungJin Techwin Co., Ltd., Daejeon, South Korea
fYear
2014
fDate
11-18 Oct. 2014
Firstpage
273
Lastpage
277
Abstract
Technical issues on measuring the low residual voltage (Vres) in SPD determined in international standards are reviewed. The SPD for power supplies represents residual voltages more than 1.5kV but the SPD for applications in low voltage data, communications and signaling circuits shows several tens ~ hundreds volts. Thus, it is necessary to determine detailed technical specifications in a technical standard for implementing its accurate measurements. However, there are no such detailed specifications in international standards and that may cause confusions in operating a certification system based on the international standard for SPD performance. Therefore, in this study, technical issues on international standards for measuring the low residual voltages of SPD are reviewed.
Keywords
IEC standards; surge protection; voltage measurement; SPD; international standards; low residual voltage measurement; surge protective devices; Low voltage; Measurement uncertainty; Noise measurement; Probes; Standards; IEC; SPD; bandwith; impulse; residual voltage(Ures); voltage probe;
fLanguage
English
Publisher
ieee
Conference_Titel
Lightning Protection (ICLP), 2014 International Conference o
Conference_Location
Shanghai
Type
conf
DOI
10.1109/ICLP.2014.6973135
Filename
6973135
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