DocumentCode
1718594
Title
A CMOS circuit for real-time chip temperature measurement
Author
Boyle, S.R. ; Heald, R.A.
fYear
1994
Firstpage
286
Lastpage
291
Abstract
The usual way to measure chip temperature is to measure the forward voltage, V/sub f/, of the temperature-characterized on-chip diode. Unfortunately, the diode V/sub f/ measurement is obscured by switching noise on the chip if the chip is running. The noise makes it impractical, if not impossible, to measure the V/sub f/ and temperature of a chip during actual operation. A noise-immune chip temperature sensor circuit has been designed and implemented on Intergraph Clipper C400 CMOS chips. The temperature sensor is a current-controlled CMOS ring oscillator which sends out a squarewave signal whose frequency decreases with temperature. The sensor and signal are relatively immune to the noise of the CMOS chip. The noise immunity allows the chip temperature to be measured while the chip is running. This paper describes the design, performance, and some applications of this real-time chip temperature measuring circuit.<>
Keywords
CMOS integrated circuits; electric sensing devices; integrated circuit testing; temperature measurement; Intergraph Clipper C400 CMOS chips; applications; current-controlled CMOS ring oscillator; design; forward voltage; noise-immune chip temperature sensor circuit; performance; real-time chip temperature measuring circuit; squarewave signal; temperature-characterized on-chip diode; Circuit noise; Diodes; Frequency; Noise measurement; Packaging; Ring oscillators; Semiconductor device measurement; Temperature measurement; Temperature sensors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Compcon Spring '94, Digest of Papers.
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-8186-5380-9
Type
conf
DOI
10.1109/CMPCON.1994.282911
Filename
282911
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