DocumentCode :
1718869
Title :
Experimental Investigation on Electromagnetic Radiation Effects to an Electronic System Through EMP Source
Author :
Zhiliang, Tan ; Rongqi, Zhang ; Penghao, Xie
Author_Institution :
Mech. Eng. Coll., Shijiazhuang
fYear :
2007
Abstract :
The radiation effect experiment to a complicated electronic system by using of GW ultra-wide band (UWB) radiation source has been carried out. In cases of opening or closing the door of device under test (DUT) , the responses of test points on combination No.04 and No.08 of DUT have been measured. The response characteristics of test points on combination No.02 have been tested at different orientations of antenna of EUT And spectrum analysis has been performed for response waveforms. The results have shown that the response voltage on internal circuits of EUT may reach about 1.6 kV at condition of opening door of DUT when radiated by UWB source with 2.0 X 104 V/m of field strength (rise time is 0.3 ns and pulse width is 3~4 ns). The maximum response voltage on combination No.02 is about 1.6 kV under condition of optimum coupling of antenna. In this case, some of the electronic components which are sensitive to electromagnetic field may be damaged.
Keywords :
electromagnetic compatibility; electromagnetic pulse; electromagnetic radiation effect; electronic system; maximum response voltage; ultra-wide band radiation source; Antenna measurements; Circuit testing; EMP radiation effects; Electromagnetic radiation; Performance analysis; Performance evaluation; Pulse circuits; Radiation effects; Space vector pulse width modulation; Voltage; Electromagnetic radiation; Response; Ultra-wide band (UWB);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
Type :
conf
DOI :
10.1109/ICEMI.2007.4350495
Filename :
4350495
Link To Document :
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