• DocumentCode
    171943
  • Title

    Measurement of PDMS refractive index by low-coherence interferometry

  • Author

    Kacik, Daniel ; Tatar, Peter ; Martincek, Ivan

  • Author_Institution
    Dept. of Phys., Univ. of Zilina, Zilina, Slovakia
  • fYear
    2014
  • fDate
    19-20 May 2014
  • Firstpage
    662
  • Lastpage
    665
  • Abstract
    We present a modification of the interferometric method for the measurement of the refractive index of the optical sample. The spectral low coherence interferometry technique utilizes an almost all-fiber Michelson interferometer with an air-path variable optical delay line. The length of the air-path variable optical delay line can be easily adapted to the various thickness and refractive indexes of investigated optical samples that is of particular importance for specialty optical sample characterisation. We record a series of spectral interferograms to measure the equalisation wavelength as a function of the path length difference. A second order polynomial fit is applied to the measured data. Comparing the fitting dependencies obtained for polydimethylsiloxane (PDMS) and reference fiber we get the spectral dependence of refractive index of PDMS. The described method can be practical tool for laboratories with the need of inexpensive and easily built set-up for measurement of refractive index of specialty optical samples in a broad spectral range.
  • Keywords
    Michelson interferometers; fibre optic sensors; light interferometry; optical delay lines; optical polymers; polymer fibres; polynomials; refractive index measurement; PDMS refractive index measurement; air-path variable optical delay line; all-fiber Michelson interferometer; equalisation wavelength; optical sample characterisation; path length difference; polydimethylsiloxane; second order polynomial fit; spectral interferogram; spectral low coherence interferometry technique; Atmospheric measurements; Indexes; Length measurement; Optical interferometry; Optical sensors; Particle measurements; Thickness measurement; PDMS; equalisation wavelength; low-coherence interferometry; refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ELEKTRO, 2014
  • Conference_Location
    Rajecke Teplice
  • Print_ISBN
    978-1-4799-3720-2
  • Type

    conf

  • DOI
    10.1109/ELEKTRO.2014.6848983
  • Filename
    6848983