DocumentCode :
1719809
Title :
Polysilicon packaging and a new anchoring technology for thick SOI MEMS ynamic response model and application to over-damped inertial sensors
Author :
Diem, B. ; Barbé, J.C. ; de Crecy, F. ; Giroud, S. ; Renaud, D. ; Grange, H. ; Hammond, J. ; Vandemeer, J. ; Roop, R. ; Gogoi, B.
Author_Institution :
CEA-LETI, Grenoble, France
Volume :
1
fYear :
2005
Firstpage :
527
Abstract :
A new technology has been developed that combines high aspect ratio SOI surface micromachining with polysilicon packaging and a new nitride anchor process with robust release etch manufacturing margin. Based on an accurate damping model, the thickness of the SOI layer was defined to achieve an overdamped mechanical response and high performance on a low g accelerometer. Over-damping is required to filter the noise from parasitic vibration in automotive applications. This technology was designed for low cost and high performance inertial sensors.
Keywords :
accelerometers; damping; electronics packaging; micromachining; microsensors; silicon-on-insulator; anchoring technology; automotive applications; damping model; dynamic response model; high aspect ratio SOI surface micromachining; low g accelerometer; nitride anchor process; over-damped inertial sensors; parasitic vibration; polysilicon packaging; release etch manufacturing; thick SOI MEMS; Accelerometers; Damping; Etching; Filters; Manufacturing processes; Micromachining; Micromechanical devices; Noise robustness; Packaging; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1496470
Filename :
1496470
Link To Document :
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