DocumentCode
1719831
Title
Research on Conversion Relation Between Square Wave and ESD EMP in the Electromagnetic Damage of Electronic Devices
Author
Rongqi, Zhang ; Zhiliang, Tan ; Penghao, Xie
Author_Institution
Mech. Eng. Coll., Shijiazhuang
fYear
2007
Firstpage
23377
Lastpage
24838
Abstract
By proceeding from micro electromagnetic damage function of the device, combining with domestic and foreign research achievement on square wave EMP damage, the relation between the damage data of square wave and it of ESD EMP is analyzed. The dependence among the damage data of square wave and it of ESD EMP is setup tentatively. Then, the conversion among damage voltage of square wave and it of ESD EMP is finished.
Keywords
electromagnetic pulse; electrostatic discharge; radiation effects; semiconductor device models; ESD EMP; conversion relation; electromagnetic damage; electronic devices; square wave EMP damage; EMP radiation effects; Electromagnetic analysis; Electromagnetic devices; Electromagnetic scattering; Electrostatic discharge; Equations; Instruments; Mechanical variables measurement; Predictive models; Space vector pulse width modulation; ESD; Semiconductor; electromagnetic damage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4350532
Filename
4350532
Link To Document