• DocumentCode
    1719831
  • Title

    Research on Conversion Relation Between Square Wave and ESD EMP in the Electromagnetic Damage of Electronic Devices

  • Author

    Rongqi, Zhang ; Zhiliang, Tan ; Penghao, Xie

  • Author_Institution
    Mech. Eng. Coll., Shijiazhuang
  • fYear
    2007
  • Firstpage
    23377
  • Lastpage
    24838
  • Abstract
    By proceeding from micro electromagnetic damage function of the device, combining with domestic and foreign research achievement on square wave EMP damage, the relation between the damage data of square wave and it of ESD EMP is analyzed. The dependence among the damage data of square wave and it of ESD EMP is setup tentatively. Then, the conversion among damage voltage of square wave and it of ESD EMP is finished.
  • Keywords
    electromagnetic pulse; electrostatic discharge; radiation effects; semiconductor device models; ESD EMP; conversion relation; electromagnetic damage; electronic devices; square wave EMP damage; EMP radiation effects; Electromagnetic analysis; Electromagnetic devices; Electromagnetic scattering; Electrostatic discharge; Equations; Instruments; Mechanical variables measurement; Predictive models; Space vector pulse width modulation; ESD; Semiconductor; electromagnetic damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-1136-8
  • Electronic_ISBN
    978-1-4244-1136-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2007.4350532
  • Filename
    4350532