Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

High-density, high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room temperature X and γ-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high speed analog signal processing. These instruments extend the noise measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors