Title :
New surface morphology for low stress thin-film-coated thermal neutron detectors
Author :
McGregor, Douglas S. ; Klann, Raymond T. ; Gersch, Holly K. ; Ariesanti, ElsaElsa ; Sanders, Jeffrey D. ; VanDerElzen, Brian
Author_Institution :
SMART Lab., Michigan Univ., Ann Arbor, MI, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Experimental devices using patterns of holes etched into semiconductor surfaces are under evaluation for use as neutron detectors. The devices have miniature holes equidistantly spaced so as to completely cover the front surface of a planar semiconductor device. The devices have both electrical contacts and neutron reactive coatings applied over the surface and within the holes. The tiny via holes assist in thin-film adhesion while offering a method to increase the thermal-neutron detection efficiency
Keywords :
gallium arsenide; neutron detection; semiconductor counters; surface topography; GaAs-B; electrical contacts; miniature holes; neutron detectors; neutron reactive coatings; planar semiconductor device; semiconductor surfaces; surface morphology; thermal-neutron detection efficiency; thin-film adhesion; Adhesives; Coatings; Contacts; Detectors; Etching; Neutrons; Semiconductor devices; Semiconductor thin films; Surface morphology; Thermal stresses;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7324-3
DOI :
10.1109/NSSMIC.2001.1009304
