• DocumentCode
    1720191
  • Title

    Advances in the crystal growth of semiinsulating CdZnTe for radiation detector applications

  • Author

    Szeles, Csaba ; Cameron, Scott E. ; Ndap, Jean-Olivier ; Chalmers, William C.

  • Author_Institution
    II-VI Inc., Saxonburg, PA, USA
  • Volume
    4
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    2424
  • Lastpage
    2428
  • Abstract
    The growth of large-volume semi-insulating CdZnTe single crystals with improved structural perfection has been demonstrated by the electro-dynamic gradient (EDG) technique and active control of the Cd partial pressure in the ampoule. The EDG technique nearly completely eliminates the uncontrolled radiative heat transport commonly encountered in traditional Bridgman systems where the charge and furnace move relative to each other. The control of the Cd partial pressure allowed the solidification and cool-down of the ingots close to the stoichiometric composition. As a result, the formation and incorporation of large size (⩾1 μm diameter) Te inclusions was avoided during crystallization and ingots with high structural perfection were achieved. CdZnTe crystals with 109-1010 Ωcm electrical resistivity, good detector performance and electron mobility-lifetime product as high as μTe=1.2×10-3 cm2/V were obtained using the EDG technique
  • Keywords
    II-VI semiconductors; carrier lifetime; crystal growth from melt; crystallisation; electrical resistivity; electron mobility; inclusions; semiconductor counters; Cd partial pressure; CdZnTe; CdZnTe detector; EDG technique; Te inclusions; crystal growth; crystallization; electrical resistivity; electro-dynamic gradient technique; electron lifetime; electron mobility; Crystalline materials; Crystallization; Crystals; Electric resistance; Furnaces; Photonic band gap; Pressure control; Radiation detectors; Tellurium; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2001 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-7324-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2001.1009309
  • Filename
    1009309