• DocumentCode
    1720305
  • Title

    The AFM tweezers: integration of a tweezers function with an AFM probe

  • Author

    Takekawa, Tetsuva ; Nakagawa, Kazuhisa ; Hashiguchi, Gen

  • Author_Institution
    Fac. of Eng., Kagawa Univ., Takamatsu, Japan
  • Volume
    1
  • fYear
    2005
  • Firstpage
    621
  • Abstract
    A prototype of AFM (atomic force microscope) tweezers is presented. In order to combine the function of nano objects manipulation with AFM observation, we have developed a tweezers-type AFM probe device using micromachining technology. The device has two thin wedge-type arms shaped by anisotropic etching and local oxidation of silicon techniques; one arm plays the role of an AFM probe, and another plays that of a manipulation probe in cooperation with monolithically fabricated microactuators. We have successfully demonstrated the function of picking up nanoparticles by the developed AFM tweezers.
  • Keywords
    atomic force microscopy; etching; microactuators; micromachining; micromanipulators; nanoparticles; nanopositioning; oxidation; probes; silicon; AFM probe; AFM tweezers; Si; anisotropic etching; atomic force microscope; local silicon oxidation; micromachining technology; monolithically fabricated microactuators; nano object manipulation; thin wedge-type arms; Anisotropic magnetoresistance; Arm; Atomic force microscopy; Etching; Microactuators; Micromachining; Oxidation; Probes; Prototypes; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
  • Print_ISBN
    0-7803-8994-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2005.1496494
  • Filename
    1496494