DocumentCode
1720357
Title
High resolution Schottky CdTe diode detector
Author
Takahashi, Tadayuki ; Mitani, Takefumi ; Kobayashi, Yoshihito ; Kouda, Manabu ; Sato, Goro ; Watanabe, Shin ; Nakazawa, Kazuhiro ; Okada, Yuu ; Funaki, Minoru ; Ohno, Ryoichi ; Mori, Kunishiro
Author_Institution
Dept. of Phys., Univ. of Tokyo, Japan
Volume
4
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
2464
Lastpage
2468
Abstract
We describe recent progress on the use of Schottky CdTe diode detectors for spectrometry. The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with previous CdTe detectors. For a relatively thin detector of 0.5-1 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of better than 600 eV FWHM at 60 keV for a 2×2 mm2 device without any charge-loss correction electronics. Large area detectors with dimensions of 21×21 mm2 are now available with an energy resolution of ~2.8 keV. Long term stability can be easily attained for relatively thin (< 1 mm) detectors, if they are cooled or operated under a high bias voltage
Keywords
Schottky diodes; X-ray detection; X-ray spectrometers; cadmium compounds; energy loss of particles; gamma-ray detection; gamma-ray spectrometers; nuclear electronics; radiation monitoring; semiconductor counters; 0.5 to 1 mm; 2 mm; 60 keV; CdTe; charge collection efficiency; charge-loss correction electronics; energy resolution; high electric field; high resolution Schottky diode detector; higher bias voltage; large area detectors; low leakage current; spectrometry; Electrodes; Energy resolution; Envelope detectors; Gamma ray detection; Gamma ray detectors; Leakage current; Physics; Schottky diodes; Semiconductor diodes; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location
San Diego, CA
ISSN
1082-3654
Print_ISBN
0-7803-7324-3
Type
conf
DOI
10.1109/NSSMIC.2001.1009317
Filename
1009317
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