DocumentCode :
1720357
Title :
High resolution Schottky CdTe diode detector
Author :
Takahashi, Tadayuki ; Mitani, Takefumi ; Kobayashi, Yoshihito ; Kouda, Manabu ; Sato, Goro ; Watanabe, Shin ; Nakazawa, Kazuhiro ; Okada, Yuu ; Funaki, Minoru ; Ohno, Ryoichi ; Mori, Kunishiro
Author_Institution :
Dept. of Phys., Univ. of Tokyo, Japan
Volume :
4
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
2464
Lastpage :
2468
Abstract :
We describe recent progress on the use of Schottky CdTe diode detectors for spectrometry. The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with previous CdTe detectors. For a relatively thin detector of 0.5-1 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of better than 600 eV FWHM at 60 keV for a 2×2 mm2 device without any charge-loss correction electronics. Large area detectors with dimensions of 21×21 mm2 are now available with an energy resolution of ~2.8 keV. Long term stability can be easily attained for relatively thin (< 1 mm) detectors, if they are cooled or operated under a high bias voltage
Keywords :
Schottky diodes; X-ray detection; X-ray spectrometers; cadmium compounds; energy loss of particles; gamma-ray detection; gamma-ray spectrometers; nuclear electronics; radiation monitoring; semiconductor counters; 0.5 to 1 mm; 2 mm; 60 keV; CdTe; charge collection efficiency; charge-loss correction electronics; energy resolution; high electric field; high resolution Schottky diode detector; higher bias voltage; large area detectors; low leakage current; spectrometry; Electrodes; Energy resolution; Envelope detectors; Gamma ray detection; Gamma ray detectors; Leakage current; Physics; Schottky diodes; Semiconductor diodes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
ISSN :
1082-3654
Print_ISBN :
0-7803-7324-3
Type :
conf
DOI :
10.1109/NSSMIC.2001.1009317
Filename :
1009317
Link To Document :
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