• DocumentCode
    1720714
  • Title

    Undergraduate research opportunities in microelectronics at Boise State University

  • Author

    Burkett, S. ; Lusth, J. ; Russell, D. ; Knowlton, W.B. ; Parke, S.

  • Author_Institution
    Boise State Univ., ID, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    78
  • Lastpage
    82
  • Abstract
    Several opportunities exist for undergraduates in the microelectronics area at Boise State University. This paper describes the Research Experience for Undergraduates (REU) program funded by the National Science Foundation and other opportunities that have resulted for undergraduates due to external support. BSU became a NSF REU site for microelectronics research in 1999. Each year, 10 students are recruited nationwide from various engineering and science disciplines to come to BSU for 8 weeks. The students work intensively with various faculty advisors and graduate student mentors. Another unique feature of our program is the tie to local industry. In 1999-2001, three students have and will benefit from an interaction with a local company, SCP Global Technologies, and this is described
  • Keywords
    electronic engineering education; integrated circuit technology; research initiatives; semiconductor technology; Boise State University; NSF REU site; National Science Foundation; Research Experience for Undergraduates program; faculty advisors; graduate students; local industry interaction; microelectronics; microelectronics area; microelectronics research; undergraduate research opportunities; Chemistry; Cleaning; Collaboration; Computer science; Educational institutions; Employee welfare; Laboratories; Mechanical engineering; Microelectronics; Recruitment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2001. Proceedings of the Fourteenth Biennial
  • Conference_Location
    Richmond, VA
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-6691-3
  • Type

    conf

  • DOI
    10.1109/UGIM.2001.960298
  • Filename
    960298