Title :
The alternate polarization current method for conduction analysis in polymers
Author :
Filippini, J.C. ; Tobazéon, R. ; Marteau, C. ; Coelho, R. ; Matallana, J. ; Janah, H.
Author_Institution :
Lab. d´´Electrostatique et des Materiaux Dielectriques, Univ. Joseph Fourier, Grenoble, France
Abstract :
The alternate polarization current method, also known as alternate square wave method (asw), is an improved technique to characterize insulating materials. It consists in recording the transient current flowing during successive applications, on the sample, of alternate positive and negative steps of voltage of low magnitude, and averaging the data over a number of cycles. Whereas the conventional technique measures the current under a unique voltage step of generally rather high magnitude, hence in a more or less unsteady state leading to scattered results, and may involve injection process, the asw technique based on a dynamic equilibrium gives reproducible results. In this communication we present the results of measurements performed on two specimens of low density polyethylene using a new equipment of high sensitivity. Current vs. time characteristics using various poling stresses, step durations and temperatures are presented. Particular attention is paid on short time behaviour characterized by a t-n decay function with n always larger than one. A way for physical interpretation is proposed. The interest of the method for material characterization is pointed out.
Keywords :
dielectric polarisation; organic insulating materials; polymers; alternate polarization current method; alternate square wave method; conduction analysis; dynamic equilibrium; injection process; insulating materials; low density polyethylene; polymers; t-n decay function; transient current; Conducting materials; Current measurement; Density measurement; Dynamic equilibrium; Insulation; Low voltage; Optical polarization; Performance evaluation; Polymers; Scattering;
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
DOI :
10.1109/ICSD.2004.1350303