Title :
An on-chip IDDT current sensor based on current-to-voltage conversion
Author :
Gyepes, Gábor ; Arbet, Daniel ; Majer, Libor ; Stopjaková, Viera
Author_Institution :
Dept. of IC Design & Test, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
In this paper, the dynamic supply current test (IDDT) for logic circuits is presented, where the targeted defects are weak opens in regular structures (SRAM arrays). Considerations about the current based tests are made, and a method of IDDT sensor realization is presented. The method is based on conversion of the current waveform to a voltage waveform. Also the most effective parameters of both the dynamic supply current waveform and voltage waveform are analyzed and evaluated.
Keywords :
SRAM chips; electric current measurement; electric sensing devices; logic circuits; SRAM array; current-to-voltage conversion; dynamic supply current test; dynamic supply current waveform; logic circuit; on-chip IDDT current sensor; voltage waveform; Circuit faults; Differential amplifiers; Logic gates; Monitoring; Random access memory; Sensors; Testing; IDDT; current test; dynamic supply current test; open defects;
Conference_Titel :
Applied Electronics (AE), 2012 International Conference on
Conference_Location :
Pilsen
Print_ISBN :
978-1-4673-1963-8
