DocumentCode
1721347
Title
Arcing and voltage breakdown in vacuum microelectronics microwave devices using field emitter arrays: causes and possible solutions
Author
Charbonnier, F.
Author_Institution
Linfield Res. Inst., McMinnville, OR, USA
fYear
1997
Firstpage
126
Abstract
Summary form only given. We review briefly the differences between conventional and microelectronics devices which impact field emitter array (FEA) performance. We then review recent progress and state of the art FEA performance, analyze a number of possible causes of failure and suggest methods, particularly coating FEAs with refractory carbides, in order to stabilize FEAs and achieve prolonged arc free operation at increased current level.
Keywords
coatings; microwave tubes; vacuum arcs; vacuum breakdown; vacuum microelectronics; arc free operation; arcing; coatings; current level; failure; field emitter array performance; field emitter arrays; microelectronics devices; refractory carbides; review; vacuum microelectronics microwave devices; voltage breakdown; Dielectric breakdown; Field emitter arrays; Laser theory; Microelectronics; Microwave antenna arrays; Microwave devices; Semiconductor laser arrays; Surface emitting lasers; Vacuum arcs; Vacuum breakdown;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location
San Diego, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3990-8
Type
conf
DOI
10.1109/PLASMA.1997.604378
Filename
604378
Link To Document