Title :
Arcing and voltage breakdown in vacuum microelectronics microwave devices using field emitter arrays: causes and possible solutions
Author_Institution :
Linfield Res. Inst., McMinnville, OR, USA
Abstract :
Summary form only given. We review briefly the differences between conventional and microelectronics devices which impact field emitter array (FEA) performance. We then review recent progress and state of the art FEA performance, analyze a number of possible causes of failure and suggest methods, particularly coating FEAs with refractory carbides, in order to stabilize FEAs and achieve prolonged arc free operation at increased current level.
Keywords :
coatings; microwave tubes; vacuum arcs; vacuum breakdown; vacuum microelectronics; arc free operation; arcing; coatings; current level; failure; field emitter array performance; field emitter arrays; microelectronics devices; refractory carbides; review; vacuum microelectronics microwave devices; voltage breakdown; Dielectric breakdown; Field emitter arrays; Laser theory; Microelectronics; Microwave antenna arrays; Microwave devices; Semiconductor laser arrays; Surface emitting lasers; Vacuum arcs; Vacuum breakdown;
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-3990-8
DOI :
10.1109/PLASMA.1997.604378
