Title :
Turn-off failure mechanisms in gto thyristors of different anode designs supported by 3-d simulations
Author :
Bleichner, H. ; Nordgren, K. ; Rosling, M. ; Jonsson, P. ; Nordlander, E.
Author_Institution :
Uppsala University
fDate :
6/16/1905 12:00:00 AM
Keywords :
Anodes; Buffer layers; Circuit simulation; Educational institutions; Electric variables measurement; Failure analysis; Fingers; Phase measurement; Semiconductor optical amplifiers; Thyristors;
Conference_Titel :
Device Research Conference, 1994. 52nd Annual
DOI :
10.1109/DRC.1994.1009404
