• DocumentCode
    1721593
  • Title

    Analysis of leakage currents in multiple gate poly-si thin film transistors for active matrix liquid crystal displays

  • Author

    Hack, M. ; Wu, I-Wei

  • Author_Institution
    Xerox Palo Alto Research Center
  • fYear
    1994
  • fDate
    6/16/1905 12:00:00 AM
  • Firstpage
    51
  • Lastpage
    52
  • Keywords
    Active matrix liquid crystal displays; Computer hacking; Electric variables; Leakage current; MOS devices; Numerical simulation; Silicon; Switches; Thin film transistors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1994. 52nd Annual
  • Type

    conf

  • DOI
    10.1109/DRC.1994.1009412
  • Filename
    1009412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1721593