Title :
Laser produced silicon field emission arrays
Author :
Evtukh, A.A. ; Kaganovich, E.B. ; Litovchenko, V.G. ; Marchenko, R.I. ; Svechnikov, S.V. ; Manoilov, E.G.
Author_Institution :
Inst. of Semicond. Phys., Kiev, Ukraine
Abstract :
Summary form only given. Commonly the Si tips of electron emitters are manufactured using the wet or dry etching formation routes. The aim of this work is to create Si field emitters without lithography by using new laser technology. Monocrystalline Si wafers were processed on air by YAG:Nd/sup 3+/ laser irradiation with energy density that overstepped the melting threshold with following stain etch. When the laser beam scanned the wafer in the continuous regime, we obtained a strongly macrorough surface without single tips. Under the influence of one by one laser pulses, the single conical tips were formed. The distances between tips were 50 /spl mu/m, their heights were 50-100 /spl mu/m, as the SEM micrographs showed. In both cases the surfaces are very developed with many protuberances on them.
Keywords :
electron field emission; elemental semiconductors; laser beam applications; scanning electron microscopy; silicon; vacuum microelectronics; 20 to 100 mum; 50 mum; SEM micrographs; Si; Si field emitters; Si tips; YAG:Nd; YAG:Nd/sup 3+/ laser irradiation; YAl5O12:Nd; continuous regime; dry etching; electron emitters; energy density; field emission arrays; laser technology; macrorough surface; melting threshold; monocrystalline Si wafers; protuberances; single conical tips; stain etch; wet etching; Cathodes; Field emitter arrays; Laboratories; Laser beams; Laser theory; Optical arrays; Optical modulation; Semiconductor laser arrays; Silicon; Surface emitting lasers;
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-3990-8
DOI :
10.1109/PLASMA.1997.604379